Every contamination-sensitive product has a critical particle size. And a process where it is most at risk.
APMON and SUMON are deployed across seven sectors — wherever a product surface is exposed to a particle that can cause it to fail.
The physics of particle contamination does not change between industries. A particle settles from the air under gravity. It transfers from a surface under contact. It deposits at a rate that depends on air cleanliness, ventilation efficiency, and the behavior of the people in the room. What changes between industries is the product: the critical particle size that causes a functional failure, the vulnerable surface area that must stay clean, and the exposure time during which contamination risk is highest.
ISO 14644-17:2021 provides the framework that connects product sensitivity to cleanroom requirement. The Cleanliness Control Method developed by Koos Agricola at Brookhuis Applied Technologies applies this framework across every sector where particle contamination determines product quality, yield, or mission outcome. APMON measures particle deposition rate at the product surface. SUMON measures the particle fall-out level on contact surfaces. Together they address the complete contamination picture — in electronics assembly rooms, automotive production lines, aerospace integration facilities, medical device cleanrooms, defense programs, semiconductor back-end operations, and precision manufacturing of every kind.
The seven sector pages below describe the specific contamination challenge, the relevant standards, and the role of APMON and SUMON in each application. Each page follows the same logic: what the customer experiences, why it happens, and what changes when the right measurement is in place.
